short ar_execute_bit (short board, short testType);
This routine performs BIT functionality testing of each matching ARINC 429 transmit/receive channel pair on the specified device. When executing BIT functionality, you must assure external data is not present on any receive channel of the device.
Input |
||
Name |
Type |
Description |
board |
short |
(input) Device Number for the board to test, (valid range is 0-15). |
testType |
short |
(input) type of test to execute, defined as follows: AR_BIT_FULL_STARTUP (1) invokes device initialization
followed by an internal wrap test of all matched transmit/ receive channels,
regardless of prior invocation of the API routine AR_BYPASS_WRAP_TEST. AR_BIT_PERIODIC (2) invokes a timer-deviation
test, providing basic health status of the device. AR_BIT_INT_LOOPBACK (3) invokes an internal wrap test of all
matched transmit/receive channels. AR_BIT_EXT_LOOPBACK (4) invokes an external wrap test of all
matched transmit/receive channels. AR_BIT_PARTIAL_SRAM (8) invokes a short destructive test of
select, unused SRAM locations AR_BIT_FULL_SRAM (9) invokes a destructive test of all
SRAM locations AR_BIT_SELECT_SRAM_MIN
to AR_BIT_SELECT_SRAM_MAX (100 to 1123) |
Name |
Type |
Description |
status |
short |
status of the function
call, with valid values of: ARS_BOARD_MUTEX Access to the Board Lock
timed-out/failed. ARS_WRAP_DROP_FAIL
A transmitted ARINC 429 message was dropped. ARS_INVARG Invalid testType parameter. ARS_FAILURE Timer-deviation test failed. |
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